A ray tracing method for predicting contrast in neutral atom beam imaging.

Lambrick, S M; Bergin, M; Jardine, A P; Ward, D J

Lambrick, S M; Bergin, M; Jardine, A P; Ward, D J.

Afiliação

Lambrick SM; Department of Physics, The Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK. Electronic address: sml59@cam.ac.uk.
Bergin M; Department of Physics, The Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK. Electronic address: mb802@cam.ac.uk.
Jardine AP; Department of Physics, The Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK. Electronic address: apj24@cam.ac.uk.
Ward DJ; Department of Physics, The Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK. Electronic address: djw77@cam.ac.uk.

Micron ; 113: 61-68, 2018 10.

Article em En | MEDLINE | ID: mdl-30007858

Palavras-chave

Atomic microscopy; Helium atom scattering; Ray tracing; Scanning helium microscopy; Simulated imaging

Texto completo

Adicionar na Minha BVS

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies / Risk_factors_studies Idioma: En Revista: Micron Assunto da revista: DIAGNOSTICO POR IMAGEM Ano de publicação: 2018 Tipo de documento: Article País de publicação: Reino Unido

Texto completo

Adicionar na Minha BVS

Imprimir

XML

PubMed Links

Buscar no Google