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An N-Heterocyclic Carbene Based Silver Precursor for Plasma-Enhanced Spatial Atomic Layer Deposition of Silver Thin Films at Atmospheric Pressure.
Boysen, Nils; Hasselmann, Tim; Karle, Sarah; Rogalla, Detlef; Theirich, Detlef; Winter, Manuela; Riedl, Thomas; Devi, Anjana.
Afiliação
  • Boysen N; Inorganic Materials Chemistry, Chair of Inorganic Chemistry II, Ruhr University Bochum, Universitätsstraße 150, 44801, Bochum, Germany.
  • Hasselmann T; Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Straße 21, 42119, Wuppertal, Germany.
  • Karle S; Inorganic Materials Chemistry, Chair of Inorganic Chemistry II, Ruhr University Bochum, Universitätsstraße 150, 44801, Bochum, Germany.
  • Rogalla D; RUBION, Ruhr University Bochum, 44801, Bochum, Germany.
  • Theirich D; Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Straße 21, 42119, Wuppertal, Germany.
  • Winter M; Inorganic Materials Chemistry, Chair of Inorganic Chemistry II, Ruhr University Bochum, Universitätsstraße 150, 44801, Bochum, Germany.
  • Riedl T; Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Straße 21, 42119, Wuppertal, Germany.
  • Devi A; Inorganic Materials Chemistry, Chair of Inorganic Chemistry II, Ruhr University Bochum, Universitätsstraße 150, 44801, Bochum, Germany.
Angew Chem Int Ed Engl ; 57(49): 16224-16227, 2018 Dec 03.
Article em En | MEDLINE | ID: mdl-30260065
ABSTRACT
A new N-heterocyclic carbene (NHC)-based silver amide compound, 1,3-di-tert-butyl-imidazolin-2-ylidene silver(I) 1,1,1-trimethyl-N-(trimethylsilyl)silanaminide [(NHC)Ag(hmds)] was synthesized and analyzed by single-crystal X-ray diffraction, 1 H and 13 C NMR spectroscopy, as well as EI mass spectrometry, and subsequently evaluated for its thermal characteristics. This new halogen- and phosphine-free Ag atomic layer deposition (ALD) precursor was tested successfully for silver thin film growth in atmospheric pressure plasma enhanced spatial (APP-ALD). High-purity conductive Ag thin films with a low sheet resistance of 0.9 Ω/sq (resistivity 10-5  Ωcm) were deposited at 100 °C and characterized by X-ray photoelectron spectroscopy, scanning electron microscopy, optical transmittance, and Rutherford back-scattering techniques. The carbene-based Ag precursor and the new APP-ALD process are significant developments in the field of precursor chemistry as well as metal ALD processing.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Angew Chem Int Ed Engl Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Alemanha País de publicação: ALEMANHA / ALEMANIA / DE / DEUSTCHLAND / GERMANY

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Angew Chem Int Ed Engl Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Alemanha País de publicação: ALEMANHA / ALEMANIA / DE / DEUSTCHLAND / GERMANY