Analysis of spatial point patterns in electron-counting images.

Kodama, Tetsuji; Nakashima, Yusuke; Akashi, Tetsuya; Takahashi, Yoshio; Mori, Shigeo; Harada, Ken

Kodama, Tetsuji; Nakashima, Yusuke; Akashi, Tetsuya; Takahashi, Yoshio; Mori, Shigeo; Harada, Ken.

Afiliação

Kodama T; Faculty of Science and Technology, Meijo University, Nagoya 468-8502, Japan.
Nakashima Y; Faculty of Science and Technology, Meijo University, Nagoya 468-8502, Japan.
Akashi T; Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan.
Takahashi Y; Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan.
Mori S; Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.
Harada K; Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.

Microscopy (Oxf) ; 71(3): 142-151, 2022 Jun 06.

Article em En | MEDLINE | ID: mdl-35139211

Assuntos

Elétrons

Palavras-chave

direct detection sensor; electron counting; spatial point pattern; spatial randomness

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Elétrons Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Japão País de publicação: Reino Unido

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