In Situ Reflectometry and Diffraction Investigation of the Multiscale Structure of p-Type Polysilicon Passivating Contacts for c-Si Solar Cells.

Morisset, Audrey; Famprikis, Theodosios; Haug, Franz-Josef; Ingenito, Andrea; Ballif, Christophe; Bannenberg, Lars J

Morisset, Audrey; Famprikis, Theodosios; Haug, Franz-Josef; Ingenito, Andrea; Ballif, Christophe; Bannenberg, Lars J.

Afiliação

Morisset A; Photovoltaics and Thin Film Electronics Laboratory, Institute of Electrical and Microengineering (IEM), Ecole Polytechnique Fédérale de Lausanne (EPFL), Maladière 71b, 2002 Neuchâtel, Switzerland.
Famprikis T; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Mekelweg 15, 2629JB Delft, The Netherlands.
Haug FJ; Photovoltaics and Thin Film Electronics Laboratory, Institute of Electrical and Microengineering (IEM), Ecole Polytechnique Fédérale de Lausanne (EPFL), Maladière 71b, 2002 Neuchâtel, Switzerland.
Ingenito A; Sustainable Energy Center, CSEM, Rue Jaquet-Droz 1, Neuchâtel, 2002, Switzerland.
Ballif C; Photovoltaics and Thin Film Electronics Laboratory, Institute of Electrical and Microengineering (IEM), Ecole Polytechnique Fédérale de Lausanne (EPFL), Maladière 71b, 2002 Neuchâtel, Switzerland.
Bannenberg LJ; Sustainable Energy Center, CSEM, Rue Jaquet-Droz 1, Neuchâtel, 2002, Switzerland.

ACS Appl Mater Interfaces ; 14(14): 16413-16423, 2022 Apr 13.

Article em En | MEDLINE | ID: mdl-35357122

Palavras-chave

SiOx; X-ray reflectometry; annealing; c-Si solar cells; in situ monitoring; passivating contacts; poly-Si

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Assunto da revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Suíça

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