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High-performance ReS2 photodetectors enhanced by a ferroelectric field and strain field.
Tai, Xiaochi; Chen, Yan; Wu, Shuaiqin; Jiao, Hanxue; Cui, Zhuangzhuang; Zhao, Dongyang; Huang, Xinning; Zhao, Qianru; Wang, Xudong; Lin, Tie; Shen, Hong; Meng, Xiangjian; Wang, Jianlu; Chu, Junhao.
Afiliação
  • Tai X; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Chen Y; School of Physical Science and Technology, ShanghaiTech University Shanghai 201210 China.
  • Wu S; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Jiao H; Department of Materials, School of Physics and Electronic Science, East China Normal University Shanghai 200241 China yanchen@ee.ecnu.edu.cn.
  • Cui Z; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Zhao D; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Huang X; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Zhao Q; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Wang X; Department of Materials, School of Physics and Electronic Science, East China Normal University Shanghai 200241 China yanchen@ee.ecnu.edu.cn.
  • Lin T; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Shen H; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Meng X; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Wang J; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
  • Chu J; State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 500 Yu Tian Road Shanghai 200083 China lin_tie@mail.sitp.ac.cn hongshen@mail.sitp.ac.cn.
RSC Adv ; 12(8): 4939-4945, 2022 Feb 03.
Article em En | MEDLINE | ID: mdl-35425495

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: RSC Adv Ano de publicação: 2022 Tipo de documento: Article País de publicação: Reino Unido

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: RSC Adv Ano de publicação: 2022 Tipo de documento: Article País de publicação: Reino Unido