In situ infrared spectroscopy depth profilometer for organic thin films.

Ran, Yixin; Yu, Jinde; Cao, Fan; Yu, Jifa; Bu, Laju; Lu, Guanghao

Ran, Yixin; Yu, Jinde; Cao, Fan; Yu, Jifa; Bu, Laju; Lu, Guanghao.

Afiliação

Ran Y; Frontier Institute of Science and Technology, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710054, China.
Yu J; Frontier Institute of Science and Technology, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710054, China.
Cao F; Frontier Institute of Science and Technology, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710054, China.
Yu J; Shaanxi Puguang Weishi Co. Ltd., Xi'an 710100, China.
Bu L; Frontier Institute of Science and Technology, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710054, China.
Lu G; Frontier Institute of Science and Technology, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an 710054, China.

Rev Sci Instrum ; 93(11): 113901, 2022 Nov 01.

Article em En | MEDLINE | ID: mdl-36461549

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China País de publicação: Estados Unidos

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