RESUMO
In this study, the influence of speckle size on contrast-to-noise ratio (CNR) and resolution is examined based on the object dimensions in the macroscopic and microscopic regimes. This research shows that for microscopic samples the conventional scaling laws are no longer effective and the CNR does not counter-propagate in the same manner as the resolution. To our knowledge, a deviation in CNR scaling on speckle size is observed for the first time in the field of microscopic ghost imaging. This result was verified using two different sample shapes. In addition, numerical analysis revealed that the noise of the photodiode is a limiting factor for the CNR. Based on these findings, the conditions for identifying the parameter set that maximizes the CNR and provides high resolution images was defined, which achieving high-quality microscopic ghost images.
RESUMO
Ptychography enables coherent diffractive imaging (CDI) of extended samples by raster scanning across the illuminating XUV/X-ray beam, thereby generalizing the unique advantages of CDI techniques. Table-top realizations of this method are urgently needed for many applications in sciences and industry. Previously, it was only possible to image features much larger than the illuminating wavelength with table-top ptychography although knife-edge tests suggested sub-wavelength resolution. However, most real-world imaging applications require resolving of the smallest and closely-spaced features of a sample in an extended field of view. In this work, resolving features as small as 2.5 λ (45 nm) using a table-top ptychography setup is demonstrated by employing a high-order harmonic XUV source with record-high photon flux. For the first time, a Rayleigh-type criterion is used as a direct and unambiguous resolution metric for high-resolution table-top setup. This reliably qualifies this imaging system for real-world applications e.g. in biological sciences, material sciences, imaging integrated circuits and semiconductor mask inspection.