In situ microviscoelastic measurements by polarization-interferometric monitoring of indentation depth.

new type of computer-controlled instrument has been developed to measure microviscoelastic properties of thin materials. It can independently control and measure indentation loads and depths in situ revealing information about material creep and relaxation. Sample and indenter positions are measured with a specially designed polarization interferometer. Indenter loadings can be varied between 0.5 and 10 g and held constant to +/-41 mg. The resulting indentation depths can be measured in situ to +/-1.2 nm. The load required to maintain constant indentation depths from 0.1 to 5.0 microim can be measured in situ to +/-3.3 mg and the depth held constant to +/-15 nm.

Design for a fast fluorescence laser scanning microscope.

The design of a fast fluorescence laser scanning microscope is described and illustrated, with discussion of the design consideration of the principal components, including the optical elements. The system, now under construction at the Optical Sciences Center of the University of Arizona, is expected to provide very-high-speed scanning, at a high spatial sampling density, of large object areas while retaining a flexibility of applications. The projected scanning rate approximates the rate achieved by flow cytometry; the projected rates of information generation should be orders of magnitude higher.

Ultrafast laser scanner microscope: design and construction.

The design of an ultrafast laser scanner microscope has been completed, and an experimental model has been constructed. Details of the novel objective lens design, the automatic focus system, the high-speed polygon scanner and the fast clock system are given. Results from initial tolerance testing as well as the first recorded images are presented.