RESUMO
Entangled measurement is a crucial tool in quantum technology. We propose a new entanglement measure of multi-mode detection, which estimates the amount of entanglement that can be created in a measurement. To illustrate the proposed measure, we perform quantum tomography of a two-mode detector that is comprised of two superconducting nanowire single photon detectors. Our method utilizes coherent states as probe states, which can be easily prepared with accuracy. Our work shows that a separable state such as a coherent state is enough to characterize a potentially entangled detector. We investigate the entangling capability of the detector in various settings. Our proposed measure verifies that the detector makes an entangled measurement under certain conditions, and reveals the nature of the entangling properties of the detector. Since the precise characterization of a detector is essential for applications in quantum information technology, the experimental reconstruction of detector properties along with the proposed measure will be key features in future quantum information processing.
RESUMO
Precise knowledge of an optical device's frequency response is crucial for it to be useful in most applications. Traditional methods for determining the frequency response of an optical system (e.g. optical cavity or waveguide modulator) usually rely on calibrated broadband photo-detectors or complicated RF mixdown operations. As the bandwidths of these devices continue to increase, there is a growing need for a characterization method that does not have bandwidth limitations, or require a previously calibrated device. We demonstrate a new calibration technique on an optical system (consisting of an optical cavity and a high-speed waveguide modulator) that is free from limitations imposed by detector bandwidth, and does not require a calibrated photo-detector or modulator. We use a low-frequency (DC) photo-detector to monitor the cavity's optical response as a function of modulation frequency, which is also used to determine the modulator's frequency response. Knowledge of the frequency-dependent modulation depth allows us to more precisely determine the cavity's characteristics (free spectral range and linewidth). The precision and repeatability of our technique is demonstrated by measuring the different resonant frequencies of orthogonal polarization cavity modes caused by the presence of a non-linear crystal. Once the modulator has been characterized using this simple method, the frequency response of any passive optical element can be determined to a fine resolution (e.g. kilohertz) over several gigahertz.
RESUMO
Tracking a randomly varying optical phase is a key task in metrology, with applications in optical communication. The best precision for optical-phase tracking has until now been limited by the quantum vacuum fluctuations of coherent light. Here, we surpass this coherent-state limit by using a continuous-wave beam in a phase-squeezed quantum state. Unlike in previous squeezing-enhanced metrology, restricted to phases with very small variation, the best tracking precision (for a fixed light intensity) is achieved for a finite degree of squeezing because of Heisenberg's uncertainty principle. By optimizing the squeezing, we track the phase with a mean square error 15 ± 4% below the coherent-state limit.