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Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam.
Belianinov, Alex; Burch, Matthew J; Hysmith, Holland E; Ievlev, Anton V; Iberi, Vighter; Susner, Michael A; McGuire, Michael A; Maksymovych, Peter; Chyasnavichyus, Marius; Jesse, Stephen; Ovchinnikova, Olga S.
Afiliação
  • Belianinov A; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Burch MJ; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Hysmith HE; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Ievlev AV; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Iberi V; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Susner MA; The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • McGuire MA; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Maksymovych P; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Chyasnavichyus M; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Knoxville, TN, 37996, USA.
  • Jesse S; Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
  • Ovchinnikova OS; Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
Sci Rep ; 7(1): 16619, 2017 11 30.
Article em En | MEDLINE | ID: mdl-29192283
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article