Photoexcited Muon Spin Spectroscopy: A New Method for Measuring Excess Carrier Lifetime in Bulk Silicon.

Yokoyama, K; Lord, J S; Miao, J; Murahari, P; Drew, A J

Yokoyama, K; Lord, J S; Miao, J; Murahari, P; Drew, A J.

Afiliação

Yokoyama K; School of Physics and Astronomy, Queen Mary University of London, Mile End, London E1 4NS, United Kingdom.
Lord JS; ISIS, STFC Rutherford Appleton Laboratory, Didcot OX11 0QX, United Kingdom.
Miao J; ISIS, STFC Rutherford Appleton Laboratory, Didcot OX11 0QX, United Kingdom.
Murahari P; School of Physics and Astronomy, Queen Mary University of London, Mile End, London E1 4NS, United Kingdom.
Drew AJ; College of Physical Science and Technology, Sichuan University, Chengdu 610064, People's Republic of China.

Phys Rev Lett ; 119(22): 226601, 2017 Dec 01.

Article em En | MEDLINE | ID: mdl-29286821

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article