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Reliability Improvement in Solution-Processed ZrO2 Dielectrics Due to Addition of H2O2.
Kim, Minsoo; Choi, Pyungho; Lee, Jeonghyun; Lim, Kiwon; Hyeon, Younghwan; Koo, Kwangjun; Choi, Byoungdeog.
Afiliação
  • Kim M; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Choi P; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Lee J; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Lim K; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Hyeon Y; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Koo K; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Choi B; College of Information and Communication Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
J Nanosci Nanotechnol ; 18(9): 5876-5881, 2018 09 01.
Article em En | MEDLINE | ID: mdl-29677709
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
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PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article