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Defect-Induced (Dis)Order in Relaxor Ferroelectric Thin Films.
Saremi, Sahar; Kim, Jieun; Ghosh, Anirban; Meyers, Derek; Martin, Lane W.
Afiliação
  • Saremi S; Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA.
  • Kim J; Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA.
  • Ghosh A; Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA.
  • Meyers D; Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA.
  • Martin LW; Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, USA.
Phys Rev Lett ; 123(20): 207602, 2019 Nov 15.
Article em En | MEDLINE | ID: mdl-31809085
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article
Texto completo
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PubMed Links
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article