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Polarizing and depolarizing charge injection through a thin dielectric layer in a ferroelectric-dielectric bilayer.
Park, Hyeon Woo; Hyun, Seung Dam; Lee, In Soo; Lee, Suk Hyun; Lee, Yong Bin; Oh, Minsik; Kim, Beom Yong; Ryoo, Seung Gyu; Hwang, Cheol Seong.
Afiliação
  • Park HW; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Hyun SD; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Lee IS; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Lee SH; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Lee YB; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Oh M; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Kim BY; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Ryoo SG; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
  • Hwang CS; Department of Materials Science and Engineering, and Inter-University Semiconductor Research Center, College of Engineering, Seoul National University, Seoul 151-744, Republic of Korea. cheolsh@snu.ac.kr.
Nanoscale ; 13(4): 2556-2572, 2021 Feb 04.
Article em En | MEDLINE | ID: mdl-33476352
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article