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Highly Efficient Experimental Approach to Evaluate Metal to 2D Semiconductor Interfaces in Vertical Diodes with Asymmetric Metal Contacts.
Kim, Seonyeong; Shin, Dong Hoon; Kim, Yong-Sung; Lee, In Ho; Lee, Chang-Won; Seo, Sunae; Jung, Suyong.
Afiliação
  • Kim S; Interdisciplinary Materials Measurement Institute, Korea Research Institute of Standards and Science, Daejeon 34113, Korea (Republic of).
  • Shin DH; Department of Physics, Sejong University, Seoul 05006, Korea (Republic of).
  • Kim YS; Department of Physics, Ewha Womans University, Seoul 03760, Korea (Republic of).
  • Lee IH; Interdisciplinary Materials Measurement Institute, Korea Research Institute of Standards and Science, Daejeon 34113, Korea (Republic of).
  • Lee CW; Interdisciplinary Materials Measurement Institute, Korea Research Institute of Standards and Science, Daejeon 34113, Korea (Republic of).
  • Seo S; Department of Applied Optics, Institute of Advanced Optics and Photonics, Hanbat National University, Daejeon, 34158, Korea (Republic of).
  • Jung S; Department of Physics, Sejong University, Seoul 05006, Korea (Republic of).
ACS Appl Mater Interfaces ; 13(23): 27705-27712, 2021 Jun 16.
Article em En | MEDLINE | ID: mdl-34082527
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article