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Unraveling the origin of ferroelectric resistance switching through the interfacial engineering of layered ferroelectric-metal junctions.
Xue, Fei; He, Xin; Ma, Yinchang; Zheng, Dongxing; Zhang, Chenhui; Li, Lain-Jong; He, Jr-Hau; Yu, Bin; Zhang, Xixiang.
Afiliação
  • Xue F; Hangzhou Global Scientific and Technological Innovation Centre, Zhejiang University, Hangzhou, 311200, China. fei.xue@kaust.edu.sa.
  • He X; Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, 23955-6900, Saudi Arabia. fei.xue@kaust.edu.sa.
  • Ma Y; Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, 23955-6900, Saudi Arabia.
  • Zheng D; Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, 23955-6900, Saudi Arabia.
  • Zhang C; Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, 23955-6900, Saudi Arabia.
  • Li LJ; Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, 23955-6900, Saudi Arabia.
  • He JH; Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal, 23955-6900, Saudi Arabia.
  • Yu B; Department of Materials Science and Engineering, City University of Hong Kong, Kowloon, Hong Kong, China.
  • Zhang X; Hangzhou Global Scientific and Technological Innovation Centre, Zhejiang University, Hangzhou, 311200, China.
Nat Commun ; 12(1): 7291, 2021 Dec 15.
Article em En | MEDLINE | ID: mdl-34911970

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article