Spectrum collapse, narrow linewidth, and Bogatov effect in diode lasers locked to high-Q optical microresonators.

We present a novel method allowing high-power single-frequency emission with sub-kHz linewidth from a compact multi-frequency diode laser locked to high-Q optical microresonator. Using high-Q MgF2microresonator and multi-frequency diode laser operating at 1535 nm with the output power of 100 mW and an emission spectrum consisting of approximately 50 lines with MHz linewidth, we observed a spectrum collapse to a single line or several lines with a sub-kHz linewidth and output power power of 50 mW. The Bogatov effect predicted more than 30 years ago was observed and studied in the spectrum of the locked laser. For analysis of the considered effect, original theoretical model taking into account self-injection locking effect, mode competition and Bogatov asymmetric mode interaction was developed and numerical modeling was performed. All numerical results are in a good agreement with our experimental data. Accurate analytical estimations for the parameters critical for the considered effect were obtained. The proposed method may be applied for different types of diode lasers operating in different spectral ranges.

Soliton dual frequency combs in crystalline microresonators.

We present a novel compact dual-comb source based on a monolithic optical crystalline MgF2 multi-resonator stack. The coherent soliton combs generated in the two microresonators of the stack with the repetition rate of 12.1 GHz and difference of 1.62 MHz provided after heterodyning a 300 MHz wide radio frequency comb. An analogous system can be used for dual-comb spectroscopy, coherent LIDAR applications, and massively parallel optical communications.

Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation.

A microscopic method to inspect isolated sub 100 nm scale structures made of silicon is presented. This method is based upon an analysis of light intensity distributions at defocused images obtained along the optical axis normal to the sample plane. Experimental measurements of calibrated lines (height 50 nm, length 100 µm, and widths of 40-150 nm in 10 nm steps) on top of a monocrystalline silicon substrate are presented. Library of defocused images of calibrated lines is obtained experimentally and numerically with accordance to experimental setup parameters and measurements conditions. Processing of the measured defocused images and comparison with simulated ones from library allow one to distinguish between objects with a 10 nm change in width. It is shown that influence of optical system aberrations must be taken into account in order to achieve coincidence between simulation and measured results and increase accuracy of line width inspection accuracy. The limits of accuracy for object width measurements using this optical method are discussed.

Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.

A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+/-7.5) nm and approximately 2 mJ*cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mum resolution by a method developed here.