Efficiency enhancement in two-cell CIGS photovoltaic system with low-cost optical spectral splitter.

Spectrum splitting represents a valid alternative to multi-junction solar cells for broadband light-to-electricity conversion. While this concept has existed for decades, its adoption at the industrial scale is still stifled by high manufacturing costs and inability to scale to large areas. Here we report the experimental validation of a novel design that could allow the widespread adoption of spectrum splitting as a low-cost approach to high efficiency photovoltaic conversion. Our system consists of a prismatic lens that can be manufactured using the same methods employed for conventional CPV optic production, and two inexpensive CuInGaSe(2) (CIGS) solar cells having different composition and, thus, band gaps. We demonstrate a large improvement in cell efficiency under the splitter and show how this can lead to substantial increases in system output at competitive cost using existing technologies.

Thermal property microscopy with frequency domain thermoreflectance.

A thermal property microscopy technique based on frequency domain thermoreflectance (FDTR) is presented. In FDTR, a periodically modulated laser locally heats a sample while a second probe beam monitors the surface reflectivity, which is related to the thermal properties of the sample with an analytical model. Here, we extend FDTR into an imaging technique capable of producing micrometer-scale maps of several thermophysical properties simultaneously. Thermal phase images are recorded at multiple frequencies chosen for maximum sensitivity to thermal properties of interest according to a thermal model of the sample. The phase versus frequency curves are then fit point-by-point to obtain quantitative thermal property images of various combinations of thermal properties in multilayer samples, including the in-plane and cross-plane thermal conductivities, heat capacity, thermal interface conductance, and film thickness. An FDTR microscope based on two continuous-wave lasers is described, and a sensitivity analysis of the technique to different thermal properties is carried out. As a demonstration, we image ~3 nm of patterned titanium under 100 nm of gold on a silicon substrate, and simultaneously create maps of the thermal interface conductance and substrate thermal conductivity. Results confirm the potential of our technique for imaging and quantifying thermal properties of buried layers, indicating its utility for mapping thermal properties in integrated circuits.