Analysis of oscillatory rocking curve by dynamical diffraction in protein crystals.

High-quality protein crystals meant for structural analysis by X-ray diffraction have been grown by various methods. The observation of dynamical diffraction in protein crystals is an interesting topic because dynamical diffraction generally occurs in perfect crystals such as Si crystals. However, to our knowledge, there is no report yet on protein crystals showing clear dynamical diffraction. We wonder whether the perfection of protein crystals might still be low compared with that of high-quality Si crystals. Here, we present observations of the oscillatory profile of rocking curves for protein crystals such as glucose isomerase crystals. The oscillatory profiles are in good agreement with those predicted by the dynamical theory of diffraction. We demonstrate that dynamical diffraction occurs even in protein crystals. This suggests the possibility of the use of dynamical diffraction for the determination of the structure and charge density of proteins.

Investigation of third-order nonlinear dynamical X-ray diffraction based on a new exact solution.

Third-order nonlinear two-wave dynamical X-ray diffraction in a crystal is considered. For the Laue symmetrical case of diffraction a new exact solution is obtained. The solution is presented via Jacobi elliptic functions. Two input free parameters are essential: the deviation parameter from the Bragg exact angle and the intensity of the incident wave. It is shown that the behavior of the field inside the crystal is determined by the sign of a certain combination of these parameters. For negative and positive signs of this combination, the wavefield is periodic and the nonlinear Pendellösung effect takes place. For the nonlinear Pendellösung distance the appropriate expressions are obtained. When the above-mentioned combination is zero, the behavior of the field can be periodic as well as non-periodic and the solution is presented by elementary functions. In the nonperiodic case, the nonlinear case Pendellösung distance tends to infinity. The wavefield diffracts and propagates in a medium, whose susceptibility is modulated by the amplitudes of the wavefields. The behavior of the wavefield can be described also by an effective deviation from the Bragg exact angle. This deviation is also a function of the wavefields.

X-ray dynamical diffraction analogues of the integer and fractional Talbot effects.

The X-ray integer and fractional Talbot effect is studied under two-wave dynamical diffraction conditions in a perfect crystal, for the symmetrical Laue case of diffraction. The fractional dynamical diffraction Talbot effect is studied for the first time. A theory of the dynamical diffraction integer and fractional Talbot effect is given, introducing the dynamical diffraction comb function. An expression for the dynamical diffraction polarization-sensitive Talbot distance is established. At the rational multiple depths of the Talbot depth the wavefield amplitude for each dispersion branch is a coherent sum of the initial distributions, shifted by rational multiples of the object period and having its own phases. The simulated dynamical diffraction Talbot carpet for the Ronchi grating is presented.

Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses.

Self-amplified spontaneous emission (SASE) enables X-ray free-electron lasers (XFELs) to generate hard X-ray pulses of sub-100 fs duration. However, due to the stochastic nature of SASE, the energy spectrum fluctuates from pulse to pulse. Many experiments that employ XFEL radiation require the resolution of the spectrum of each pulse. The work presented here investigates the capacity of a thin strongly bent diamond crystal to resolve the energy spectra of hard X-ray SASE pulses by studying its diffraction properties. Rocking curves of the symmetric C*(440) reflection have been measured for different bending radii. The experimental data match the theoretical modelling based on the Takagi-Taupin equations of dynamical diffraction. A uniform strain gradient has proven to be a valid model of strain deformations in the crystal.

Mesoscopic Elastic Distortions in GaAs Quantum Dot Heterostructures.

Quantum devices formed in high-electron-mobility semiconductor heterostructures provide a route through which quantum mechanical effects can be exploited on length scales accessible to lithography and integrated electronics. The electrostatic definition of quantum dots in semiconductor heterostructure devices intrinsically involves the lithographic fabrication of intricate patterns of metallic electrodes. The formation of metal/semiconductor interfaces, growth processes associated with polycrystalline metallic layers, and differential thermal expansion produce elastic distortion in the active areas of quantum devices. Understanding and controlling these distortions present a significant challenge in quantum device development. We report synchrotron X-ray nanodiffraction measurements combined with dynamical X-ray diffraction modeling that reveal lattice tilts with a depth-averaged value up to 0.04° and strain on the order of 10-4 in the two-dimensional electron gas (2DEG) in a GaAs/AlGaAs heterostructure. Elastic distortions in GaAs/AlGaAs heterostructures modify the potential energy landscape in the 2DEG due to the generation of a deformation potential and an electric field through the piezoelectric effect. The stress induced by metal electrodes directly impacts the ability to control the positions of the potential minima where quantum dots form and the coupling between neighboring quantum dots.

Sapphire hard X-ray Fabry-Perot resonators for synchrotron experiments.

Hard X-ray Fabry-Perot resonators (FPRs) made from sapphire crystals were constructed and characterized. The FPRs consisted of two crystal plates, part of a monolithic crystal structure of Al2O3, acting as a pair of mirrors, for the backward reflection (0 0 0 30) of hard X-rays at 14.3147 keV. The dimensional accuracy during manufacturing and the defect density in the crystal in relation to the resonance efficiency of sapphire FPRs were analyzed from a theoretical standpoint based on X-ray cavity resonance and measurements using scanning electron microscopic and X-ray topographic techniques for crystal defects. Well defined resonance spectra of sapphire FPRs were successfully obtained, and were comparable with the theoretical predictions.

Third-order nonlinear and linear time-dependent dynamical diffraction of X-rays in crystals.

For the first time the third-order nonlinear time-dependent Takagi's equations of X-rays in crystals are obtained and investigated. The third-order nonlinear and linear time-dependent dynamical diffraction of X-rays spatially restricted in the diffraction plane pulses in crystals is investigated theoretically. A method of solving the linear and the third-order nonlinear time-dependent Takagi's equations is proposed. Based on this method, results of analytical and numerical calculations for both linear and nonlinear diffraction cases are presented and compared.

Focusing performance of a multilayer Laue lens with layer placement error described by dynamical diffraction theory.

The multilayer Laue lens (MLL) is essentially a linear zone plate with large aspect ratio, which can theoretically focus hard X-rays to well below 1 nm with high efficiency when ideal structures are used. However, the focusing performance of a MLL depends heavily on the quality of the layers, especially the layer placement error which always exists in real MLLs. Here, a dynamical modeling approach, based on the coupled wave theory, is proposed to study the focusing performance of a MLL with layer placement error. The result of simulation shows that this method can be applied to various forms of layer placement error.

Development of variable-magnification X-ray Bragg optics.

A novel X-ray Bragg optics is proposed for variable-magnification of an X-ray beam. This X-ray Bragg optics is composed of two magnifiers in a crossed arrangement, and the magnification factor, M, is controlled through the azimuth angle of each magnifier. The basic properties of the X-ray optics such as the magnification factor, image transformation matrix and intrinsic acceptance angle are described based on the dynamical theory of X-ray diffraction. The feasibility of the variable-magnification X-ray Bragg optics was verified at the vertical-wiggler beamline BL-14B of the Photon Factory. For X-ray Bragg magnifiers, Si(220) crystals with an asymmetric angle of 14° were used. The magnification factor was calculated to be tunable between 0.1 and 10.0 at a wavelength of 0.112 nm. At various magnification factors (M ≥ 1.0), X-ray images of a nylon mesh were observed with an air-cooled X-ray CCD camera. Image deformation caused by the optics could be corrected by using a 2 × 2 transformation matrix and bilinear interpolation method. Not only absorption-contrast but also edge-contrast due to Fresnel diffraction was observed in the magnified images.

Numerical reconstruction of an object image using an X-ray dynamical diffraction Fraunhofer hologram.

A numerical method of reconstruction of an object image using an X-ray dynamical diffraction Fraunhofer hologram is presented. Analytical approximation methods and numerical methods of iteration are discussed. An example of a reconstruction of an image of a cylindrical beryllium wire is considered. The results of analytical approximation and zero-order iteration coincide with exact values of the amplitude complex transmission coefficient of the object as predicted by the resolution limit of the scheme, except near the edges of the object. Calculations of the first- and second-order iterations improve the result at the edges of the object. This method can be applied for determination of the complex amplitude transmission coefficient of amplitude as well as phase objects. It can be used in X-ray microscopy.

Object image correction using an X-ray dynamical diffraction Fraunhofer hologram.

Taking into account background correction and using Fourier analysis, a numerical method of an object image correction using an X-ray dynamical diffraction Fraunhofer hologram is presented. An example of the image correction of a cylindrical beryllium wire is considered. A background correction of second-order iteration leads to an almost precise reconstruction of the real part of the amplitude transmission coefficient and improves the imaginary part compared with that without a background correction. Using Fourier analysis of the reconstructed transmission coefficient, non-physical oscillations can be avoided. This method can be applied for the determination of the complex amplitude transmission coefficient of amplitude as well as phase objects, and can be used in X-ray microscopy.

An alternative method to the Takagi-Taupin equations for studying dark-field X-ray microscopy of deformed crystals.

This study introduces an alternative method to the Takagi-Taupin equations for investigating the dark-field X-ray microscopy (DFXM) of deformed crystals. In scenarios where dynamical diffraction cannot be disregarded, it is essential to assess the potential inaccuracies of data interpretation based on the kinematic diffraction theory. Unlike the Takagi-Taupin equations, this new method utilizes an exact dispersion relation, and a previously developed finite difference scheme with minor modifications is used for the numerical implementation. The numerical implementation has been validated by calculating the diffraction of a diamond crystal with three components, wherein dynamical diffraction is applicable to the first component and kinematic diffraction pertains to the remaining two. The numerical convergence is tested using diffraction intensities. In addition, the DFXM image of a diamond crystal containing a stacking fault is calculated using the new method and compared with the experimental result. The new method is also applied to calculate the DFXM image of a twisted diamond crystal, which clearly shows a result different from those obtained using the Takagi-Taupin equations.

Double-slit asymmetrical dynamical diffraction of X-rays in ideal crystals.

The theoretical investigation of double-slit asymmetrical dynamical diffraction of X-rays in perfect crystals establishes that Young's interference fringes on the exit surface are formed. The position of the fringes in the cross section of the beam depends on deviation from the Bragg exact orientation and asymmetry angle. An equation for the period of the fringes is presented, according to which the period is polarization sensitive. The period increases with increasing the absolute value of the asymmetry angle. In its turn, the size of the interference region also increases with increasing the absolute value of the asymmetry angle. However, the ratio of interference region size to period, i.e. the number of observed fringes, decreases with increasing the absolute value of the asymmetry angle. The size of the interference region can be of the order of a few tens of mm, which can be used for obtaining Fourier dynamical diffraction holograms of a large size. This type of diffraction can also be used for obtaining double-slit dynamical diffraction contrast of defects and deformations. Due to the phase difference information, in comparison with single-slit diffraction, double-slit diffraction is more sensitive to the existence of objects and deformations in the path of the wave.

Laboratory-based 3D X-ray standing-wave analysis of nanometre-scale gratings.

The increasing structural complexity and downscaling of modern nanodevices require continuous development of structural characterization techniques that support R&D and manufacturing processes. This work explores the capability of laboratory characterization of periodic planar nanostructures using 3D X-ray standing waves as a promising method for reconstructing atomic profiles of planar nanostructures. The non-destructive nature of this metrology technique makes it highly versatile and particularly suitable for studying various types of samples. Moreover, it eliminates the need for additional sample preparation before use and can achieve sub-nanometre reconstruction resolution using widely available laboratory setups, as demonstrated on a diffractometer equipped with a microfocus X-ray tube with a copper anode.

Prospect for detecting magnetism in two-dimensional perovskite oxides by electron magnetic circular dichroism.

Two-dimensional (2D) magnets, especially strongly correlated 2D transition-metal perovskite oxides, have attracted significant attention due to their intriguing electromagnetic properties for potential applications in spintronic devices. Potentially electron magnetic circular dichroism (EMCD) under zone axis conditions can provide three-dimensional components of magnetic moments in 2D materials, but the collection efficiency and the signal-to-noise ratio for out-of-plane (OOP) components is limited due to the limited collection angle. Here we conducted a comprehensive computational simulation to optimize the experimental setting of EMCD for detecting the OOP components of magnetic moments in three beam conditions (3BCs) on 2D perovskite oxides La1-xSrxMnO3 (LSMO) in a TEM. The key parameters are sample thickness, accelerating voltage, Sr doping concentration, collection semi-angle and position, and sample orientation including systematic reflections excited and tilt angle. Our simulation results demonstrate that the relative dynamical diffraction coefficients of Mn OOP EMCD of LaMnO3 with a thickness ranging from 1 unit cell (uc) to 4 uc can be optimized in a 3BC with (110) systematic reflections excited and a relatively large collection semi-angle of 19 mrad at the relatively low accelerating voltage of 80 kV. In most cases, the relative dynamic diffraction coefficients for La1-xSrxMnO3 with the thickness ranging from 1 uc to 4 uc decrease with the increase of the Sr doping concentrations. The optimal tilt angle from a zone axis to a 3BC is 18° for the cases of the LSMO thickness of 2 uc, 3 uc and 4 uc, and 22° for the monolayer LSMO. Our work provides the theoretical simulation foundation for optimized EMCD experiments for measuring OOP components of magnetic moments in 2D transition-metal perovskite oxides.

X-ray dynamical diffraction Fraunhofer holography.

An X-ray dynamical diffraction Fraunhofer holographic scheme is proposed. Theoretically it is shown that the reconstruction of the object image by visible light is possible. The spatial and temporal coherence requirements of the incident X-ray beam are considered. As an example, the hologram recording as well as the reconstruction by visible light of an absolutely absorbing wire are discussed.

Double-slit X-ray dynamical diffraction in curved crystals.

The theoretical investigation of double-slit X-ray dynamical diffraction in curved crystals shows that Young's interference fringes are formed. An expression for the period of the fringes has been established which is polarization sensitive. The position of the fringes in the cross section of the beam depends on the deviation from the Bragg exact orientation for a perfect crystal, on the curvature radius and on the thickness of the crystal. This type of diffraction can be used for determination of the curvature radius by measuring the shift of the fringes from the centre of the beam.

André Authier (1932-2023).

Obituary for André Authier.

A finite difference scheme for integrating the Takagi-Taupin equations on an arbitrary orthogonal grid.

Calculating dynamical diffraction patterns for X-ray diffraction imaging techniques requires numerical integration of the Takagi-Taupin equations. This is usually performed with a simple, second-order finite difference scheme on a sheared computational grid in which two of the axes are aligned with the wavevectors of the incident and scattered beams. This dictates, especially at low scattering angles, an oblique grid of uneven step sizes. Here a finite difference scheme is presented that carries out this integration in slab-shaped samples on an arbitrary orthogonal grid by implicitly utilizing Fourier interpolation. The scheme achieves the expected second-order convergence and a similar error to the traditional approach for similarly dense grids.

Simulating dark-field X-ray microscopy images with wavefront propagation techniques.

Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.