Genetic characterization for lesion mimic and other traits in relation to spot blotch resistance in spring wheat.

Lesion mimic (Lm) mutants display hypersensitive responses (HR) without any pathogen attack; their symptoms are similar to those produced by a pathogen and result in cell death. In wheat, such mutants have been reported to be resistant against leaf rust due to their biotrophic nature. However, Lm mutants tend to encourage spot blotch (SB) disease caused by Bipolarissorokiniana since dead cells facilitate pathogen multiplication. In this study, 289 diverse wheat germplasm lines were phenotyped in three consecutive growing seasons (2012-2015). Genotype data was generated using the Illumina iSelect beadchip assay platform for wheat germplasm lines. A total of 13,589 single-nucleotide polymorphisms (SNPs) were selected andused for further association mapping. Lm was positively associated with Area Under Disease Progress Curve (AUDPC) for SB but negatively with glaucous index (GI), leaf tip necrosis (Ltn) and latent period (LP). Ltn had a negative association with AUDPC and Lm but a positive one with LP. In a genome-wide association study (GWAS), 29 markers were significantly associated with these traits and 27 were an notated. Seven SNP markers associated with Lm were on chromosome 6A; another on 1B was found to be linked with Ltn. Like wise, seven SNP markers were associated with GI; one on chromosome 6A with the others on 6B. Five SNP markers on chromosomes 3B and 3Dwere significantly correlated with LP, while nine SNP markers on chromosomes 5A and 5B were significantly associated with AUDPC for SB. This study is the first to explore the interaction in wheat between Lm mutants and the hemibiotrophic SB pathogen B.sorokiniana.

Genome-wide association mapping of spot blotch resistance in wheat association mapping initiative (WAMI) panel of spring wheat (Triticum aestivum L.).

Spot blotch (SB) caused by Bipolaris sorokiniana, is one of the most important diseases of wheat in the eastern part of south Asia causing considerable yield loss to the wheat crop. There is an urgent need to identify genetic loci closely associated with resistance to this pathogen for developing resistant cultivars. Hence, genomic regions responsible for SB resistance were searched using a wheat association mapping initiative (WAMI) panel involving 287 spring wheat genotypes of different origin. Genome-wide association mapping (GWAM) was performed using single nucleotide polymorphism (SNP) markers from a custom 90 K wheat SNP array. A mixed linear model (MLM) was used for assessing the association of SNP markers with spot blotch resistance in three consecutive years. Three traits were measured: incubation period, lesion number and area under the disease progress curve (AUDPC). Significant SNP markers were found linked to five, six and four quantitative trait loci (QTLs) for incubation period, lesion number and AUDPC respectively. They were detected on 11 different chromosomes: 1A, 1B, 1D, 4A, 5A, 5B, 6A, 6B, 6D, 7A, 7B with marker R2 range of 0.083 to 0.11. The greatest number of significant SNP-markers was found for lesion number and AUDPC on chromosome 6B and 5B, respectively, representing a better coverage of B-genome by SNPs. On the other hand, the most significant and largest SNP markers for incubation period were detected on 6A and 4A chromosomes indicating that this trait is associated with the A-genome of wheat. Although, QTLs for spot blotch resistance have been reported in wheat on these same chromosomes, the association of incubation period and lesion number with SB resistance has not been reported in previous studies. The panel exhibits considerable variation for SB resistance and also provides a good scope of marker-assisted selection using the identified SNP markers linked to resistant QTLs.