RESUMO
The 2×2 ray tracing matrix (RTM) method is employed for the description of optical aberrations caused by the refractive index mismatch (RIM) in fluorescent confocal polarization microscopy. We predict and experimentally confirm that due to the RIM a liquid crystal layer with highly non-uniform director distribution appears to be imaged as a layer with non-uniform thickness, which shows up in the roughness of the rear surface. For the off-axial focusing of the probing beam in a droplet dispersed in an immiscible liquid, we have developed an extended method still keeping the 2×2 dimensionality of the RTM.
RESUMO
The optimized conditions for the enhancement of the second harmonic generation in the composites of the orthorhombic δ-BiB3O6:Pr(3+) nanoparticles embedded in polyvinyl alcohol films and deposited on the AgGaGe2Se6, AgGaGe2.7Si0.3Se8 (90 mol.% AgGaGe3Se8 - 10 mol.% AgGaSi3Se8), and AgGaGe3Se8:Cu substrates were established. The highest second-order susceptibility was achieved during the Ag-Ga-Ge-Se crystalline substrates photo-illumination by nanosecond laser pulses of about 2900 nm wavelength. The effect was found to be completely reversible after the interruption of the photo-inducing stimulation. Complementary studies of Atomic Force Microscopy, AFM, X-ray Diffraction, XRD, and Fourier-Transform Infrared Spectroscopy, and DFT simulations of spectral dependences of the corresponding second-order nonlinear optical susceptibilities, were performed.