ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots.

Molecular depth profiling is needed to develop high-tech materials optimised to the µm or even up to the nm scale. Recent progress in time-of-flight static secondary ion mass spectrometry (ToF-S-SIMS) offers perspectives to molecular depth profiling. However, at this moment, the methodology is not yet capable to deal with a range of materials science applications because of the limited depth range, the loss of intensity in the subsurface and the loss of depth resolution at large distances from the original surface. Therefore, the purpose of this paper is to develop a complementary approach for the molecular 3D analysis at large depth, using a combination of ultra-low angle microtomy (ULAM) and surface analysis of the sectioned material with ToF-S-SIMS. Single inkjet dots with a diameter of 100 µm and height of 22 µm on a PET substrate have been used as a test system for the methodology. It is demonstrated that the use of a diamond knife allows the molecular composition and distribution of components within the microscopic feature to be probed with a lateral resolution of 300 nm. Hence the methodology approaches the physical limit for ion imaging of organic components with local concentrations in the % range. In practice, the achievable depth resolution with ULAM-S-SIMS is ultimately limited by the surface roughness of the section. Careful optimisation of the ULAM step has resulted in a surface roughness within 6 nm (R(a) value) at a depth of 21 µm. This offers perspective to achieve 3D analysis with a depth resolution as good as 18 nm at such a large distance from the surface. Furthermore, the ULAM-S-SIMS approach is applicable to materials unamenable to ion beam erosion. However, the method is limited to dealing with, for instance, Si or glass substrates that cannot be sectioned with a microtomy knife. Furthermore, sufficient adhesion between stacked layers or between the coating and substrate is required. However, it is found that the approach is applicable to a wide variety of industrially important (multi)layers of polymers on a polymer substrate.

Multi-slice computed tomography with N1177 identifies ruptured atherosclerotic plaques in rabbits.

Rupture-prone and ruptured plaques are characterized by the presence of large numbers of macrophages. N1177 is a contrast agent consisting of iodinated nanoparticles that are selectively phagocytosed by macrophages. The aim of this study was to investigate the effect of N1177 on the CT attenuation of rupture-prone and ruptured plaques in rabbits. In addition, we examined in vitro whether uptake of N1177 occurred without cytotoxic or pro-inflammatory effects on macrophages. In vitro, the viability of J774 macrophages was not affected by treatment with N1177. Moreover, N1177 had no effect on the phagocytic capacity or cytokine production of macrophages. For the in vivo experiments, 6 New Zealand White rabbits were fed a cholesterol-supplemented diet for 12-15 months, resulting in the development of large atherosclerotic plaques that resembled rupture-prone plaques in humans. In three rabbits, mechanical plaque rupture was induced by retrograde pullback of an embolic protection device. N1177 had no effect on the median density of rupture-prone plaques [35 HU (range 3-85) before injection vs. 32 HU (range 1-93) 2 h after injection of N1177; P > 0.05]. However, after induction of mechanical plaque rupture, the median density of the atherosclerotic plaques increased from 40 HU (range 6-86) before injection to 74 HU (range 14-111) 2 h after injection of N1177 (P < 0.001). Using time-of-flight static secondary ion mass spectrometry, the presence of N1177 nanoparticles was demonstrated in macrophage-rich areas of ruptured plaques, but not of non-ruptured plaques. In conclusion, our results show that N1177 is a contrast agent that can identify ruptured atherosclerotic plaques.

Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale.

Development of sustainable materials requires methods capable of probing the molecular composition of samples not only at the surface but also in depth. Static secondary ion mass spectrometry (S-SIMS) characterises the distribution of organic and inorganic compounds at the surface. Ultra-low-angle microtomy (ULAM) has been studied as an alternative or complementing method to the molecular depth profiling with, e.g. C(60)(+) projectiles. Acrylate-based multilayers relevant to industrial inkjet printing have been sectioned at a cutting angle below 1 degrees. In this way, analysis of the section over a distance of 1 microm allows a depth range in the order of a few nm in the original sample to be achieved. Adequate procedures to optimise the ULAM step and minimise or control the cutting artefacts have been developed. The combination of ULAM with S-SIMS has allowed a depth resolution of 10 nm to be obtained for components at a distance of 35 microm from the surface.

TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology.

Recent publications on static secondary ion mass spectrometry (S-SIMS) focus on molecular depth profiling by using polyatomic or ultra-low energy monoatomic projectiles. Since their applicability depends on the relationship between the ion yield and the depth, which is hard to obtain without extensive studies, a combination of a wear test method with S-SIMS surface analysis was performed in the current study. Using this non-sputtering procedure, the relation between the signal intensity and the local concentration remains in principle the same as that at the surface (which is easy to determine). Mechanical erosion was successfully applied to expose sub-surface material from organic multilayers. Through surface analysis with S-SIMS on the gradually exposed deeper planes, molecular depth profiles could be obtained. The study was conducted on a model system relevant to offset printing, consisting of two polymer layers, containing dyes and a surfactant, cast on an Al substrate.

In situ temperature-time effect on MetA-S-SIMS.

Metal-assisted (MetA) static secondary ion mass spectrometry (S-SIMS) is one of several ion yield enhancing methods developed for S-SIMS in the last decades. MetA-S-SIMS uses a very thin coating of gold or silver on the sample. Earlier experiments revealed dependence of the ion yield enhancement on the applied metal, the nature of the studied sample, the time after metallization, and the heating temperature (ex situ, i.e., under atmospheric pressure). This paper reports on the effects of time and temperature when samples are heated to temperatures between 30 and 80 degrees C inside the S-SIMS vacuum chamber (in situ). Thick layers of poly(vinylbutyral-co-vinylalcohol-co-vinylacetate) (PVB) containing dihydroxybenzophenone (DHBPh) were coated with a nm-thin-layer of gold. The S-SIMS analysis was performed over a period of several hours while samples were kept at a constant elevated temperature. Compared to ex situ heating in an oven, heating in the analysis chamber provided more rapid signal enhancement, but the magnitude of the enhancement was less (by a factor of two). Furthermore, additional experiments on ex situ heated samples revealed that storage of samples with enhanced ion yields at -8 degrees C is not sufficient to "stabilize" the enhancement. A steep decrease of the ion yields was observed as a function of time after 2.5 h.

Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions.

Static secondary ion mass spectrometry (S-SIMS) is one of the potentially most powerful and versatile tools for the analysis of surface components at the monolayer level. Current improvements in detection limit (LOD) and molecular specificity rely on the optimisation of the desorption-ionisation (DI) process. As an alternative to monoatomic projectiles, polyatomic primary ion (P.I.) bombardment increases ion yields non-linearly. Common P.I. sources are Ga+ (liquid metal ion gun (LMIG), SF5+ (electron ionisation) and the newer Au(n)+, Bi(n)q+ (both LMIG) and C60+ (electron ionisation) sources. In this study the ion yield improvement obtained by using the newly developed ion sources is assessed. Two dyes (zwitterionic and/or thermolabile polar functionalities on a largely conjugated backbone) were analysed as a thin layer using Ga+, SF5+, C60+, Bi+, Bi3(2+) and Bi5(2+) projectiles under static conditions. The study aims at evaluating the improvement in LOD, useful and characteristic yield and molecular specificity. The corrected total ion count values for the different P.I. sources are compared for different instruments to obtain a rough estimate of the improvements. Furthermore, tentative ionisation and fragmentation schemes are provided to describe the generation of radical and adduct ions. Characteristic ion yields are discussed for the different P.I. sources. An overview of the general appearances of the mass spectra obtained with the different P.I. sources is given to stress the major improvement provided by polyatomic P.I.s in yielding information at higher m/z values.

Study of the affinity of thermographic additives for silver by time-of-flight static secondary ion mass spectrometry and surface-enhanced Raman spectroscopy on silver nanoparticles.

Detection of the interactions between low molecular weight organic compounds and metals in the form of sols on a nanoscale is analytically challenging. This study aims to provide experimental evidence using a combination of UV-Vis absorption spectrometry, surface-enhanced Raman spectrometry (SERS), and static secondary ion mass spectrometry (S-SIMS). The field of application is thermography where silver images are formed via heat-catalyzed reactions. Several organic compounds called tone modifiers and stabilizers are used in thermographic materials for the optimization of the image quality. With exploitation of the strengths of each of the above-mentioned methods, an affinity ranking of several tone modifiers and a stabilizer was established on the basis of competitive adsorption experiments using different model systems. Specifically, silver sols, SERS probes, and sputter-coated silver substrates were exposed to systems with one or two additives. The UV-Vis results provided insight on the aggregation of silver nanoparticles in a hydrosol, which was necessary for the interpretation of the SERS data. Both SERS and S-SIMS measurements led to a similar ranking of the relative affinity of the additives in two components, which was largely consistent with empirical knowledge derived from macroscopic behavior.

Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systems.

Chemical engineering of high-technology products requires elucidation of intermolecular interactions in complex materials. As part of an extensive study on thermographic systems, static secondary ion mass spectrometry (S-SIMS) was used to probe the physicochemical behaviour of active compounds, such as different tone modifiers and stabilisers, on silver. In particular, the feasibility of detecting adsorption and/or binding of individual additives and mixtures to silver was examined. Substrates prepared by sputter coating silver on silicon wafers were exposed to solutions of the studied compounds in 2-butanone. The signal intensities measured with S-SIMS for the ad-layers showed reproducibility to within 10%. Radical ions containing silver such as [M-H+Ag]+ * were used as evidence for the formation of bonds in the solid. Also the [M-H+2Ag]+ ions could be assigned to chemisorbed species while [M+Ag]+ ions could be formed by adduct ionisation of molecules with co-ejected Ag+ ions. The signal intensities of [M-H+Ag]+ * and [M-H+2Ag]+ ions were used to monitor the adsorption quantitatively as a function of time.

Complementary use of Fourier transform laser microprobe mass spectrometry and time-of-flight static secondary ion mass spectrometry for the study of the surface adsorption of organic dyes on silicate materials.

The adsorption of organic ionic dyes on different pore size engineered silica materials with potential application for industrial wastewater treatment has been investigated using Fourier transform laser microprobe mass spectrometry (FT-LMMS) and time-of-flight secondary ion mass spectrometry (TOF-S-SIMS). The complementary use of the two methods with different information depth allowed data on the subsurface distribution and pore penetration of the adsorbed organic compounds. Macroscopic methods were employed to determine the amount adsorbed on the particles and the specific external surface area. Local MS analysis allows identification of the organic dyes exclusively at the outer particle surface when the pore size is inferior to the size of the adsorbing molecule, or at the surface of the channels inside the material. Specifically, the monolayer information depth of TOF-S-SIMS causes a signal to refer essentially to the adsorbate at the outer particle surface, which is only a fraction of the total adsorption in mesoporous materials, while FT-LMMS allowed detection of the presence of adsorbates at the outer surface as well as inside the subsurface of 10 to 50 nm depending on the material under study. The observed data open perspectives for the molecular monitoring of the adsorption behaviour of different materials at the (sub) microm scale.