Megahertz-rate ultrafast X-ray scattering and holographic imaging at the European XFEL.

The advent of X-ray free-electron lasers (XFELs) has revolutionized fundamental science, from atomic to condensed matter physics, from chemistry to biology, giving researchers access to X-rays with unprecedented brightness, coherence and pulse duration. All XFEL facilities built until recently provided X-ray pulses at a relatively low repetition rate, with limited data statistics. Here, results from the first megahertz-repetition-rate X-ray scattering experiments at the Spectroscopy and Coherent Scattering (SCS) instrument of the European XFEL are presented. The experimental capabilities that the SCS instrument offers, resulting from the operation at megahertz repetition rates and the availability of the novel DSSC 2D imaging detector, are illustrated. Time-resolved magnetic X-ray scattering and holographic imaging experiments in solid state samples were chosen as representative, providing an ideal test-bed for operation at megahertz rates. Our results are relevant and applicable to any other non-destructive XFEL experiments in the soft X-ray range.

Extracting contrast in an X-ray speckle visibility spectroscopy experiment under imperfect conditions.

Pump-probe experiments at synchrotrons and free-electron lasers to study ultrafast dynamics in materials far from equilibrium have been well established, but techniques to investigate equilibrium dynamics on the nano- and pico-second timescales remain underdeveloped and experimentally challenging. A promising approach relies on a double-probe X-ray speckle visibility spectroscopy setup at split-and-delay beamlines of X-ray free-electron lasers. However, the logistics in consistently producing two collinear, perfectly overlapping pulses necessary to conduct a faithful experiment is difficult to achieve. In this paper, a method is introduced to extract contrast in the case where an angular misalignment and imperfect overlap exists between the two pulses. Numerical simulations of a dynamical system show that contrast can still be extracted for significant angular misalignments accompanied by partial overlap between the two pulses.

X-ray reflectivity from curved liquid interfaces.

X-ray reflectivity studies of the structure of liquid-vapour and liquid-liquid interfaces at modern sources, such as free-electron lasers, are currently impeded by the lack of dedicated liquid surface diffractometers. It is shown that this obstacle can be overcome by an alternative experimental approach that uses the natural curvature of a liquid drop for variation of the angle of incidence. Two modes of operation are shown: (i) sequential reflectivity measurements by a nanometre beam and (ii) parallel acquisition of large ranges of a reflectivity curve by micrometre beams. The feasibility of the two methods is demonstrated by studies of the Hg/vapour, H2O/vapour and Hg/0.1 M NaF interface. The obtained reflectivity curves match the data obtained by conventional techniques up to 5αc in micro-beam mode and up to 35αc in nano-beam mode, allowing observation of the Hg layering peak.