Detalhe da pesquisa
1.
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 µm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors (Basel)
; 23(18)2023 Sep 18.
Artigo
Inglês
| MEDLINE | ID: mdl-37766015