Ice flexure forced by internal wave packets in the arctic ocean.

Tiltmeters on the Arctic Ocean were used to measure flexure of the ice forced by an energetic packet of internal waves riding the crest of diurnal internal bores emanating from the Yermak Plateau, north of the Svalbard Archipelago. The waves forced an oscillatory excursion of 36 microradians in tilt of the ice, corresponding to an excursion of 16 micrometers per second in vertical velocity at the surface and of 3.5 millimeters in surface displacement. Strainmeters embedded in the ice measured an excursion of 3 x 10(-7) in strain, consistent with ice flexure rather than compression. The measured tilt is consistent with direct measurements of excursions in horizontal current near the surface (12 centimeters per second) and in vertical displacement (36 meters) of the pycnocline 100 meters below the surface.

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement.

We combine a scanning near-field microwave microscope with an atomic force microscope for use in localized thin film dielectric constant measurement, and demonstrate the capabilities of our system through simultaneous surface topography and microwave reflection measurements on a variety of thin films grown on low resistivity silicon substrates. Reflection measurements clearly discriminate the interface between approximately 38 nm silicon nitride and dioxide thin films at 1.788 GHz. Finite element simulation was used to extract the dielectric constants showing the dielectric sensitivity to be Deltaepsilon(r)=0.1 at epsilon(r)=6.2, for the case of silicon nitride. These results illustrate the capability of our instrument for quantitative dielectric constant measurement at microwave frequencies.