Detalhe da pesquisa
1.
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 µm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors (Basel)
; 23(18)2023 Sep 18.
Artigo
Inglês
| MEDLINE | ID: mdl-37766015
2.
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Sensors (Basel)
; 19(24)2019 Dec 10.
Artigo
Inglês
| MEDLINE | ID: mdl-31835566
3.
Statistical Analysis of the Random Telegraph Noise in a 1.1 µm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.
Sensors (Basel)
; 17(12)2017 Nov 23.
Artigo
Inglês
| MEDLINE | ID: mdl-29168778