RESUMO
The angular precision of crystal orientation determination by cross-correlating dynamically simulated electron diffraction patterns with experimental patterns via spherical harmonic analysis is investigated. The best precision found in this study is 0.016°, which approaches the level reported in the literature for other high-precision electron backscatter diffraction implementations. At this angular precision, the noise floor for geometrically necessary dislocation density calculations is found to be approximately 5×1013 m-2 at a 200 nm step size. Conventional Hough-transform indexing of the same raw patterns gave an angular precision of 0.156° and a dislocation noise floor of 6×1014 m-2, an order of magnitude larger for both parameters, albeit better than is typical for Hough indexing due to the high-quality patterns used. Experimental trade-off curves of precision versus exposure time, pattern resolution (i.e. camera binning), and analysis bandwidth are also presented, allowing for optimization of data collection and analysis rates once the desired level of precision has been determined.
RESUMO
The multitiered iterative phasing (MTIP) algorithm is used to determine the biological structures of macromolecules from fluctuation scattering data. It is an iterative algorithm that reconstructs the electron density of the sample by matching the computed fluctuation X-ray scattering data to the external observations, and by simultaneously enforcing constraints in real and Fourier space. This paper presents the first ever MTIP algorithm acceleration efforts on contemporary graphics processing units (GPUs). The Compute Unified Device Architecture (CUDA) programming model is used to accelerate the MTIP algorithm on NVIDIA GPUs. The computational performance of the CUDA-based MTIP algorithm implementation outperforms the CPU-based version by an order of magnitude. Furthermore, the Heterogeneous-Compute Interface for Portability (HIP) runtime APIs are used to demonstrate portability by accelerating the MTIP algorithm across NVIDIA and AMD GPUs.
RESUMO
A new approach is proposed for the indexing of electron back-scattered diffraction (EBSD) patterns. The algorithm employs a spherical master EBSD pattern and computes its cross-correlation with a back-projected experimental pattern using the spherical harmonic transform (SHT). This approach is significantly faster than the recent dictionary indexing algorithm, but shares the latter's robustness against noise. The underlying theory is presented, followed by example applications, one on a series of Ni EBSD data sets recorded with decreasing signal-to-noise ratio, the other on a large shot-peened Al data set. The dependence of indexing speed and memory usage on the SHT bandwidth is explored. The speed gains of the new algorithm are achieved by executing real-valued Fast Fourier Transforms, explicitly incorporating crystallographic symmetry in the cross-correlation computation, and using efficient loop ordering to improve the caching behavior. The algorithm produces a cross-correlation array in the zyz Euler space; an orientation refinement procedure is proposed based on analytical derivatives of the Wigner d functions. The new approach can be applied to any diffraction modality for which the scattered intensity can be represented on a spherical surface.