Distinguishing crystallographic misorientations of lanthanum zirconate epilayers on nickel substrates by electron backscatter diffraction.

Ji, Yuan; Wang, Li; Zhang, Yinqi; Wei, Bin; Wang, Jianhong; Cheng, Yanling; Suo, Hongli.

Ji Y; Beijing University of Technology, Institute of Microstructure and Property of Advanced Materials, Beijing 100124, China. jiyuan@bjut.edu.cn

Ultramicroscopy ; 111(5): 314-9, 2011 Apr.

Article en En | MEDLINE | ID: mdl-21396525

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2011 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2011 Tipo del documento: Article