Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques.
Opt Express
; 21(14): 16431-43, 2013 Jul 15.
Article
en En
| MEDLINE
| ID: mdl-23938494
ABSTRACT
In this study we present a new measurement technique to investigate the timescales of back side ablation of conductive films, using Molybdenum as an application example from photovoltaics. With ultrashort laser pulses at fluences below 0.6 J/cm(2), we ablate the Mo film in the shape of a fully intact Mo 'disc' from a transparent substrate. By monitoring the time-dependent current flow across a specifically developed test structure, we determine the time required for the lift-off of the disc. This value decreases with increasing laser fluence down to a minimum of 21 ± 2 ns. Furthermore, we record trajectories of the discs using a shadowgraphic setup. Ablated discs escape with a maximum velocity of 150 ± 5 m/s whereas droplets of Mo forming at the center of the disc can reach velocities up to 710 ± 11 m/s.
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1
Banco de datos:
MEDLINE
Asunto principal:
Refractometría
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Ensayo de Materiales
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Conductometría
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Rayos Láser
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Membranas Artificiales
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Molibdeno
Idioma:
En
Año:
2013
Tipo del documento:
Article