3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.

Bailey, James; Havelund, Rasmus; Shard, Alexander G; Gilmore, Ian S; Alexander, Morgan R; Sharp, James S; Scurr, David J.

Bailey J; Laboratory of Biophysics and Surface Analysis, University of Nottingham , Nottingham NG7 2RD, England.

ACS Appl Mater Interfaces ; 7(4): 2654-9, 2015 Feb 04.

Article en En | MEDLINE | ID: mdl-25562665

Palabras clave

ToF-SIMS; argon; depth; multilayers; polymer; profiling

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2015 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2015 Tipo del documento: Article