Dielectric Mismatch Mediates Carrier Mobility in Organic-Intercalated Layered TiS2.

Wan, Chunlei; Kodama, Yumi; Kondo, Mami; Sasai, Ryo; Qian, Xin; Gu, Xiaokun; Koga, Kenji; Yabuki, Kazuhisa; Yang, Ronggui; Koumoto, Kunihito.

Wan C; State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, China.
Kodama Y; Graduate School of Engineering, Nagoya University , Nagoya 464-8603, Japan.
Kondo M; Graduate School of Engineering, Nagoya University , Nagoya 464-8603, Japan.
Sasai R; Graduate School of Engineering, Nagoya University , Nagoya 464-8603, Japan.
Qian X; Interdisciplinary Graduate School of Science and Engineering, Shimane University , 1060 Nishikawatsu-cho, Matsue 690-8504, Japan.
Gu X; Department of Mechanical Engineering, University of Colorado , Boulder, Colorado 80309, United States.
Koga K; Department of Mechanical Engineering, University of Colorado , Boulder, Colorado 80309, United States.
Yabuki K; KOBELCO Research Institute , Kobe, Hyogo 651-2271, Japan.
Yang R; KOBELCO Research Institute , Kobe, Hyogo 651-2271, Japan.
Koumoto K; Department of Mechanical Engineering, University of Colorado , Boulder, Colorado 80309, United States.