High Cycle Fatigue in the Transmission Electron Microscope.

Bufford, Daniel C; Stauffer, Douglas; Mook, William M; Syed Asif, S A; Boyce, Brad L; Hattar, Khalid.

Bufford DC; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States.
Stauffer D; Hysitron, Inc., Eden Prairie, Minnesota 55344, United States.
Mook WM; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States.
Syed Asif SA; Hysitron, Inc., Eden Prairie, Minnesota 55344, United States.
Boyce BL; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States.
Hattar K; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States.

Nano Lett ; 16(8): 4946-53, 2016 08 10.

Article en En | MEDLINE | ID: mdl-27351706