Fabrication of sharp atomic force microscope probes using in situ local electric field induced deposition under ambient conditions.

Temiryazev, Alexei; Bozhko, Sergey I; Robinson, A Edward; Temiryazeva, Marina.

Temiryazev A; Kotel'nikov Institute of Radioengineering and Electronics of RAS, Fryazino Branch, 141190 Fryazino, Russia.
Bozhko SI; Institute of Solid State Physics, RAS, 142432 Chernogolovka, Russia.
Robinson AE; AIST-NT Inc., 359 Bel Marin Keys Blvd., Suite 20, Novato, California 94949, USA.
Temiryazeva M; Kotel'nikov Institute of Radioengineering and Electronics of RAS, Fryazino Branch, 141190 Fryazino, Russia.

Rev Sci Instrum ; 87(11): 113703, 2016 Nov.

Article en En | MEDLINE | ID: mdl-27910651

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Banco de datos: MEDLINE Idioma: En Año: 2016 Tipo del documento: Article

Banco de datos: MEDLINE Idioma: En Año: 2016 Tipo del documento: Article