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Mechanistic insights on the electronic properties and electronic/atomic structure aspects in orthorhombic SrVO3 thin films: XANES-EXAFS study.
Sharma, Aditya; Varshney, Mayora; Cheol Lim, Weon; Shin, Hyun-Joon; Pal Singh, Jitendra; Ok Won, Sung; Hwa Chae, Keun.
  • Sharma A; Advance Analysis Centre, Korea Institute of Science and Technology (KIST), Seoul - 02792, Seoul, South Korea. sowon@kist.re.kr khchae@kist.re.kr.
  • Varshney M; Advance Analysis Centre, Korea Institute of Science and Technology (KIST), Seoul - 02792, Seoul, South Korea. sowon@kist.re.kr khchae@kist.re.kr.
  • Cheol Lim W; Advance Analysis Centre, Korea Institute of Science and Technology (KIST), Seoul - 02792, Seoul, South Korea. sowon@kist.re.kr khchae@kist.re.kr.
  • Shin HJ; Pohang Accelerator Laboratory (POSTECH), Pohang - 37673, South Korea.
  • Pal Singh J; Advance Analysis Centre, Korea Institute of Science and Technology (KIST), Seoul - 02792, Seoul, South Korea. sowon@kist.re.kr khchae@kist.re.kr.
  • Ok Won S; Advance Analysis Centre, Korea Institute of Science and Technology (KIST), Seoul - 02792, Seoul, South Korea. sowon@kist.re.kr khchae@kist.re.kr.
  • Hwa Chae K; Advance Analysis Centre, Korea Institute of Science and Technology (KIST), Seoul - 02792, Seoul, South Korea. sowon@kist.re.kr khchae@kist.re.kr.
Phys Chem Chem Phys ; 19(9): 6397-6405, 2017 Mar 01.
Article en En | MEDLINE | ID: mdl-28197617

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2017 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2017 Tipo del documento: Article