A reliable approach to prepare brittle semiconducting materials for cross-sectional transmission electron microscopy. | J Microsc;268(3): 225-229, 2017 12. | MEDLINE

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A reliable approach to prepare brittle semiconducting materials for cross-sectional transmission electron microscopy.

Dycus, J H; Lebeau, J M.

Dycus JH; Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina, U.S.A.
Lebeau JM; Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina, U.S.A.

J Microsc ; 268(3): 225-229, 2017 12.

Article en En | MEDLINE | ID: mdl-28686283

Palabras clave

Cross-sectioning; STEM; TEM; ion milling; sample preparation; wedge polishing

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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prevalence_studies Idioma: En Año: 2017 Tipo del documento: Article

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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prevalence_studies Idioma: En Año: 2017 Tipo del documento: Article