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Finite element modeling to analyze TEER values across silicon nanomembranes.
Khire, Tejas S; Nehilla, Barrett J; Getpreecharsawas, Jirachai; Gracheva, Maria E; Waugh, Richard E; McGrath, James L.
  • Khire TS; Biomedical Engineering, University of Rochester, Goergen Hall, Rochester, NY, 14627, USA.
  • Nehilla BJ; Biomedical Engineering, University of Rochester, Goergen Hall, Rochester, NY, 14627, USA.
  • Getpreecharsawas J; Nexgenia Inc., 454 North 34th St., Seattle, WA, 98103, USA.
  • Gracheva ME; Biomedical Engineering, University of Rochester, Goergen Hall, Rochester, NY, 14627, USA.
  • Waugh RE; Department of Physics, Clarkson University, 277 Science Center, Potsdam, NY, 13699, USA.
  • McGrath JL; Biomedical Engineering, University of Rochester, Goergen Hall, Rochester, NY, 14627, USA.
Biomed Microdevices ; 20(1): 11, 2018 01 05.
Article en En | MEDLINE | ID: mdl-29305767
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Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Impedancia Eléctrica / Análisis de Elementos Finitos / Nanoestructuras / Membranas Artificiales Tipo de estudio: Prognostic_studies Límite: Animals Idioma: En Año: 2018 Tipo del documento: Article
Texto completo
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XML
PubMed Links
Search on Google

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Impedancia Eléctrica / Análisis de Elementos Finitos / Nanoestructuras / Membranas Artificiales Tipo de estudio: Prognostic_studies Límite: Animals Idioma: En Año: 2018 Tipo del documento: Article