Your browser doesn't support javascript.
loading
Stable contrast mode on TiO2(110) surface with metal-coated tips using AFM.
Li, Yan Jun; Wen, Huanfei; Zhang, Quanzhen; Adachi, Yuuki; Arima, Eiji; Kinoshita, Yukinori; Nomura, Hikaru; Ma, Zongmin; Kou, Lili; Tsukuda, Yoshihiro; Naitoh, Yoshitaka; Sugawara, Yasuhiro; Xu, Rui; Cheng, Zhihai.
  • Li YJ; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan; National Key Laboratory for Electronic Measurement and Technology, North University of China. No. 3, Xueyuan Road, Taiyuan, Shan Xi 030051, China. Electronic address: liyanjun@ap.eng.osaka-u.ac.jp.
  • Wen H; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Zhang Q; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Adachi Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Arima E; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Kinoshita Y; Research Center for Engineering Science, Graduate School of Engineering and Resource Science Akita University, 1-1, Gakuencho, Tegata, Akita 010-8502, Japan.
  • Nomura H; Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
  • Ma Z; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan; National Key Laboratory for Electronic Measurement and Technology, North University of China. No. 3, Xueyuan Road, Taiyuan, Shan Xi 030051, China.
  • Kou L; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Tsukuda Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Naitoh Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Sugawara Y; Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
  • Xu R; CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, PR China.
  • Cheng Z; CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, PR China.
Ultramicroscopy ; 191: 51-55, 2018 08.
Article en En | MEDLINE | ID: mdl-29803917

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2018 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2018 Tipo del documento: Article