Near interface ionic transport in oxygen vacancy stabilized cubic zirconium oxide thin films.
Phys Chem Chem Phys
; 20(41): 26068-26071, 2018 Nov 07.
Article
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| MEDLINE
| ID: mdl-30307015
ABSTRACT
The cubic phase of pure zirconia (ZrO2) is stabilized in dense thin films through a controlled introduction of oxygen vacancies (O defects) by cold-plasma-based sputtering deposition. Here, we show that the cubic crystals present at the film/substrate interface near-region exhibit fast ionic transport, which is superior to what is obtained with similar yttrium-stabilized cubic zirconia thin films.
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