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Selective Engineering of Chalcogen Defects in MoS2 by Low-Energy Helium Plasma.
Huang, Binjie; Tian, Feng; Shen, Youde; Zheng, Minrui; Zhao, Yunshan; Wu, Jing; Liu, Yi; Pennycook, Stephen J; Thong, John T L.
  • Huang B; Department of Electrical and Computer Engineering , National University of Singapore , 117583 , Singapore.
  • Tian F; NUS Graduate School for Integrative Sciences and Engineering , National University of Singapore , 119077 , Singapore.
  • Shen Y; Center for Advanced 2D Materials , National University of Singapore , 117542 , Singapore.
  • Zheng M; Department of Electrical and Computer Engineering , National University of Singapore , 117583 , Singapore.
  • Zhao Y; Department of Electrical and Computer Engineering , National University of Singapore , 117583 , Singapore.
  • Wu J; Department of Electrical and Computer Engineering , National University of Singapore , 117583 , Singapore.
  • Liu Y; Institute of Materials Research and Engineering , Agency for Science Technology and Research , 138634 , Singapore.
  • Pennycook SJ; Department of Electrical and Computer Engineering , National University of Singapore , 117583 , Singapore.
  • Thong JTL; Center for Advanced 2D Materials , National University of Singapore , 117542 , Singapore.
ACS Appl Mater Interfaces ; 11(27): 24404-24411, 2019 Jul 10.
Article en En | MEDLINE | ID: mdl-31199625

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2019 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2019 Tipo del documento: Article