Thickness Dependence of Ferroelectric and Optical Properties in Pb(Zr0.53Ti0.47)O3 Thin Films.

Thickness Dependence of Ferroelectric and Optical Properties in Pb(Zr_0.53Ti_0.47)O₃ Thin Films.

He, Jian; Li, Fen; Chen, Xi; Qian, Shuo; Geng, Wenping; Bi, Kaixi; Mu, Jiliang; Hou, Xiaojuan; Chou, Xiujian.

He J; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. drhejian@nuc.edu.cn.
Li F; Taiyuan Heavy Machinery Group Co., Ltd., Taiyuan 030024, China. drhejian@nuc.edu.cn.
Chen X; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. S1706037@st.nuc.edu.cn.
Qian S; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. S1706010@st.nuc.edu.cn.
Geng W; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. qianshuo@nuc.edu.cn.
Bi K; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. wenpinggeng@nuc.edu.cn.
Mu J; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. bikaixi@nuc.edu.cn.
Hou X; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. mujiliang@nuc.edu.cn.
Chou X; Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China. houxiaojuan@nuc.edu.cn.