Probing thermal transport across amorphous region embedded in a single crystalline silicon nanowire.

Zhao, Yunshan; Liu, Xiangjun; Rath, Ashutosh; Wu, Jing; Li, Baowen; Zhou, WuXing; Xie, Guofeng; Zhang, Gang; Thong, John T L.

Zhao Y; Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117583, Republic of Singapore. elezyun@nus.edu.sg.
Liu X; Institute of Micro/Nano Electromechanical System, College of Mechanical Engineering, Donghua University, Shanghai, 201620, China.
Rath A; Department of Materials Science and Engineering, National University of Singapore, Singapore, 117575, Republic of Singapore.
Wu J; Institute of Materials Research and Engineering, Agency for Science, Technology and Research, Singapore, 138634, Republic of Singapore.
Li B; Department of Mechanical Engineering, University of Colorado, Boulder, 80309, USA.
Zhou W; School of Materials Science and Engineering, Hunan University of Science and Technology, Xiangtan, 411201, China.
Xie G; School of Materials Science and Engineering, Hunan University of Science and Technology, Xiangtan, 411201, China.
Zhang G; Institute of High Performance Computing, Singapore, Singapore, 138632, Republic of Singapore. zhangg@ihpc.a-star.edu.sg.
Thong JTL; Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117583, Republic of Singapore. john_thong@nus.edu.sg.

Sci Rep ; 10(1): 821, 2020 Jan 21.

Article en En | MEDLINE | ID: mdl-31964924

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2020 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2020 Tipo del documento: Article