High-Precision Acceleration Measurement System Based on Tunnel Magneto-Resistance Effect.

Gao, Lu; Chen, Fang; Yao, Yingfei; Xu, Dacheng.

Gao L; School of Electronic and Information Engineering, Soochow University, Suzhou 215006, China.
Chen F; Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China.
Yao Y; School of Electronic and Information Engineering, Soochow University, Suzhou 215006, China.
Xu D; School of Electronic and Information Engineering, Soochow University, Suzhou 215006, China.

Sensors (Basel) ; 20(4)2020 Feb 18.

Article en En | MEDLINE | ID: mdl-32085651