A brief prehistory of double descent.

Loog, Marco; Viering, Tom; Mey, Alexander; Krijthe, Jesse H; Tax, David M J.

Loog M; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands; m.loog@tudelft.nl.
Viering T; Department of Computer Science, University of Copenhagen, 1165 Copenhagen, Denmark.
Mey A; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands.
Krijthe JH; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands.
Tax DMJ; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands.

Proc Natl Acad Sci U S A ; 117(20): 10625-10626, 2020 05 19.

Article en En | MEDLINE | ID: mdl-32371495

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2020 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2020 Tipo del documento: Article