Analysing quantized resistance behaviour in graphene Corbino <i>p-n</i> junction devices.

Analysing quantized resistance behaviour in graphene Corbino p-n junction devices.

Liu, Chieh-I; Scaletta, Dominick S; Patel, Dinesh K; Kruskopf, Mattias; Levy, Antonio; Hill, Heather M; Rigosi, Albert F.

Liu CI; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
Scaletta DS; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742, United States.
Patel DK; Department of Physics, Mount San Jacinto College, Menifee, CA 92584, United States.
Kruskopf M; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
Levy A; Department of Physics, National Taiwan University, Taipei 10617, Taiwan.
Hill HM; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
Rigosi AF; Joint Quantum Institute, University of Maryland, College Park, MD 20742, United States.

J Phys D Appl Phys ; 53(27)2020.

Article en En | MEDLINE | ID: mdl-32831402