Your browser doesn't support javascript.
loading
Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification.
Xu, Liang; Liu, Zexuan; Datta, Animesh; Knee, George C; Lundeen, Jeff S; Lu, Yan-Qing; Zhang, Lijian.
  • Xu L; National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China.
  • Liu Z; National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China.
  • Datta A; Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom.
  • Knee GC; Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom.
  • Lundeen JS; Max Planck Centre for Extreme and Quantum Photonics, Department of Physics, University of Ottawa, 25 Templeton Street, Ottawa, Ontario K1N 6N5, Canada.
  • Lu YQ; National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China.
  • Zhang L; National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China.
Phys Rev Lett ; 125(8): 080501, 2020 Aug 21.
Article en En | MEDLINE | ID: mdl-32909785
ABSTRACT
Weak-value amplification (WVA) is a metrological protocol that amplifies ultrasmall physical effects. However, the amplified outcomes necessarily occur with highly suppressed probabilities, leading to the extensive debate on whether the overall measurement precision is improved in comparison to that of conventional measurement (CM). Here, we experimentally demonstrate the unambiguous advantages of WVA that overcome practical limitations including noise and saturation of photodetection and maintain a shot-noise-scaling precision for a large range of input light intensity well beyond the dynamic range of the photodetector. The precision achieved by WVA is 6 times higher than that of CM in our setup. Our results clear the way for the widespread use of WVA in applications involving the measurement of small signals including precision metrology and commercial sensors.

Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Guideline Idioma: En Año: 2020 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Guideline Idioma: En Año: 2020 Tipo del documento: Article