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Charge trapping by iodine ions in photorefractive Sn2P2S6 crystals.
Scherrer, E M; Giles, N C; Dodson, T E R; Grabar, A A; Evans, D R; Basun, S A; Slagle, J E; Halliburton, L E.
  • Scherrer EM; Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433, USA.
  • Giles NC; Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433, USA.
  • Dodson TER; Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433, USA.
  • Grabar AA; Institute for Solid State Physics and Chemistry, Uzhhorod National University, 88000 Uzhhorod, Ukraine.
  • Evans DR; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433, USA.
  • Basun SA; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433, USA.
  • Slagle JE; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433, USA.
  • Halliburton LE; Azimuth Corporation, 2970 Presidential Drive, Suite 200, Fairborn, Ohio 45324, USA.
J Chem Phys ; 153(14): 144503, 2020 Oct 14.
Article en En | MEDLINE | ID: mdl-33086799

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2020 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2020 Tipo del documento: Article