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Association of Spectral-Domain OCT With Long-term Disability Worsening in Multiple Sclerosis.
Lambe, Jeffrey; Fitzgerald, Kathryn C; Murphy, Olwen C; Filippatou, Angeliki G; Sotirchos, Elias S; Kalaitzidis, Grigorios; Vasileiou, Elena; Pellegrini, Nicole; Ogbuokiri, Esther; Toliver, Brandon; Luciano, Nicholas J; Davis, Simidele; Fioravante, Nicholas; Kwakyi, Ohemaa; Risher, Hunter; Crainiceanu, Ciprian M; Prince, Jerry L; Newsome, Scott D; Mowry, Ellen M; Saidha, Shiv; Calabresi, Peter A.
  • Lambe J; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Fitzgerald KC; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Murphy OC; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Filippatou AG; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Sotirchos ES; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Kalaitzidis G; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Vasileiou E; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Pellegrini N; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Ogbuokiri E; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Toliver B; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Luciano NJ; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Davis S; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Fioravante N; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Kwakyi O; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Risher H; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Crainiceanu CM; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Prince JL; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Newsome SD; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Mowry EM; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Saidha S; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
  • Calabresi PA; From the Department of Neurology (J.L., K.C.F., O.C.M., A.G.F., E.S.S., G.K., E.V., N.P., E.O., B.T., N.J.L., S.D., N.F., O.K., H.R., S.D.N., E.M.M., S.S., P.A.C.), Johns Hopkins University School of Medicine; and Departments of Biostatistics (C.M.C.) and Electrical and Computer Engineering (J.L.P.)
Neurology ; 96(16): e2058-e2069, 2021 04 20.
Article en En | MEDLINE | ID: mdl-33653904
ABSTRACT

OBJECTIVE:

To evaluate whether a retinal spectral-domain optical coherence tomography (SD-OCT) assessment at baseline is associated with long-term disability worsening in people with multiple sclerosis (PwMS), we performed SD-OCT and Expanded Disability Status Scale (EDSS) assessments among 132 PwMS at baseline and at a median of 10 years later.

METHODS:

In this prospective, longitudinal study, participants underwent SD-OCT, EDSS, and visual acuity (VA) assessments at baseline and at follow-up. Statistical analyses were performed using generalized linear regression models, adjusted for age, sex, race, multiple sclerosis (MS) subtype, and baseline disability. We defined clinically meaningful EDSS worsening as an increase of ≥2.0 if baseline EDSS score was <6.0 or an increase of ≥1.0 if baseline EDSS score was ≥6.0.

RESULTS:

A total of 132 PwMS (mean age 43 years; 106 patients with relapsing-remitting MS) were included in analyses. Median duration of follow-up was 10.4 years. In multivariable models excluding eyes with prior optic neuritis, relative to patients with an average baseline ganglion cell + inner plexiform layer (GCIPL) thickness ≥70 µm (the mean GCIPL thickness of all eyes at baseline), an average baseline GCIPL thickness <70 µm was associated with a 4-fold increased odds of meaningful EDSS worsening (adjusted odds ratio [OR] 3.97, 95% confidence interval [CI] 1.24-12.70; p = 0.02) and an almost 3-fold increased odds of low-contrast VA worsening (adjusted OR 2.93, 95% CI 1.40-6.13; p = 0.04).

CONCLUSIONS:

Lower baseline GCIPL thickness on SD-OCT is independently associated with long-term disability worsening in MS. Accordingly, SD-OCT at a single time point may help guide therapeutic decision-making among individual PwMS. CLASSIFICATION OF EVIDENCE This study provides Class I evidence that lower baseline GCIPL thickness on SD-OCT is independently associated with long-term disability worsening in MS.
Asunto(s)

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Esclerosis Múltiple Tipo de estudio: Observational_studies / Prognostic_studies / Risk_factors_studies Límite: Adult / Female / Humans / Male / Middle aged Idioma: En Año: 2021 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Esclerosis Múltiple Tipo de estudio: Observational_studies / Prognostic_studies / Risk_factors_studies Límite: Adult / Female / Humans / Male / Middle aged Idioma: En Año: 2021 Tipo del documento: Article