Electronic Modulation Caused by Interfacial Ni-O-M (M=Ru, Ir, Pd) Bonding for Accelerating Hydrogen Evolution Kinetics.

Deng, Liming; Hu, Feng; Ma, Mingyue; Huang, Shao-Chu; Xiong, Yixing; Chen, Han-Yi; Li, Linlin; Peng, Shengjie.

Deng L; College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
Hu F; College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
Ma M; College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
Huang SC; Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan.
Xiong Y; College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
Chen HY; Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan.
Li L; College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
Peng S; College of Materials Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.

Angew Chem Int Ed Engl ; 60(41): 22276-22282, 2021 Oct 04.

Article en En | MEDLINE | ID: mdl-34427019