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Demonstration of negative refraction induced by synthetic gauge fields.
Yang, Yihao; Ge, Yong; Li, Rujiang; Lin, Xiao; Jia, Ding; Guan, Yi-Jun; Yuan, Shou-Qi; Sun, Hong-Xiang; Chong, Yidong; Zhang, Baile.
  • Yang Y; Interdisciplinary Center for Quantum Information, State Key Laboratory of Modern Optical Instrumentation, ZJU-Hangzhou Global Science and Technology Innovation Center, Zhejiang University, Hangzhou 310027, China.
  • Ge Y; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371, Singapore.
  • Li R; Centre for Disruptive Photonic Technologies, The Photonics Institute, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore.
  • Lin X; Research Center of Fluid Machinery Engineering and Technology, School of Physics and Electronic Engineering, Jiangsu University, Zhenjiang 212013, China.
  • Jia D; Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371, Singapore.
  • Guan YJ; Centre for Disruptive Photonic Technologies, The Photonics Institute, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore.
  • Yuan SQ; Interdisciplinary Center for Quantum Information, State Key Laboratory of Modern Optical Instrumentation, ZJU-Hangzhou Global Science and Technology Innovation Center, Zhejiang University, Hangzhou 310027, China.
  • Sun HX; Research Center of Fluid Machinery Engineering and Technology, School of Physics and Electronic Engineering, Jiangsu University, Zhenjiang 212013, China.
  • Chong Y; Research Center of Fluid Machinery Engineering and Technology, School of Physics and Electronic Engineering, Jiangsu University, Zhenjiang 212013, China.
  • Zhang B; Research Center of Fluid Machinery Engineering and Technology, School of Physics and Electronic Engineering, Jiangsu University, Zhenjiang 212013, China.
Sci Adv ; 7(50): eabj2062, 2021 Dec 10.
Article en En | MEDLINE | ID: mdl-34878836