Ultra-fast data sanitization of SRAM by back-biasing to resist a cold boot attack.

Han, Seong-Joo; Han, Joon-Kyu; Yun, Gyeong-Jun; Lee, Mun-Woo; Yu, Ji-Man; Choi, Yang-Kyu.

Han SJ; School of Electrical Engineering, Korea Advanced Institute of Science and Technology, (KAIST) 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea.
Han JK; School of Electrical Engineering, Korea Advanced Institute of Science and Technology, (KAIST) 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea.
Yun GJ; School of Electrical Engineering, Korea Advanced Institute of Science and Technology, (KAIST) 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea.
Lee MW; School of Electrical Engineering, Korea Advanced Institute of Science and Technology, (KAIST) 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea.
Yu JM; School of Electrical Engineering, Korea Advanced Institute of Science and Technology, (KAIST) 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea.
Choi YK; School of Electrical Engineering, Korea Advanced Institute of Science and Technology, (KAIST) 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea. ykchoi@ee.kaist.ac.kr.

Sci Rep ; 12(1): 35, 2022 Jan 07.

Article en En | MEDLINE | ID: mdl-34997028

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2022 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2022 Tipo del documento: Article